Unclamped inductive stressing of GaN and SiC Cascode power devices to failure at elevated temperatures (2022)
Attributed to:
Supergen Energy Networks hub 2018
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2022.114711
Publication URI: http://dx.doi.org/10.1016/j.microrel.2022.114711
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability