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Unclamped inductive stressing of GaN and SiC Cascode power devices to failure at elevated temperatures (2022)

First Author: Gunaydin Y

Attributed to: Supergen Energy Networks hub 2018 funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2022.114711

Publication URI: http://dx.doi.org/10.1016/j.microrel.2022.114711

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability