Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry (2022)
Attributed to:
CORNERSTONE: Capability for OptoelectRoNics, mEtamateRialS, nanoTechnOlogy aNd sEnsing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/12.2626785
Publication URI: http://dx.doi.org/10.1117/12.2626785
Type: Conference/Paper/Proceeding/Abstract