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56 Gbps Si/GeSi integrated EAM (2018)

First Author: Gardes F

Attributed to: CORNERSTONE: Capability for OptoelectRoNics, mEtamateRialS, nanoTechnOlogy aNd sEnsing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2502709

Publication URI: http://dx.doi.org/10.1117/12.2502709

Type: Conference/Paper/Proceeding/Abstract