Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy (2022)

First Author: Naresh-Kumar G
Attributed to:  Nanoanalysis for Advanced Materials and Healthcare funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0080024

Publication URI: http://dx.doi.org/10.1063/5.0080024

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 7