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XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples (2018)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2018.04.077

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2018.04.077

Type: Journal Article/Review

Parent Publication: Applied Surface Science