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Native point defects of semiconducting layered Bi2O2Se. (2018)

First Author: Li H

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41598-018-29385-8

PubMed Identifier: 30026542

Publication URI: http://europepmc.org/abstract/MED/30026542

Type: Journal Article/Review

Volume: 8

Parent Publication: Scientific reports

Issue: 1

ISSN: 2045-2322