Theoretically probing the relationship between barrier length and resistance in Al/AlO x /Al tunnel junctions (2022)
Attributed to:
Quantum Electronics Device Modelling (QUANTDEVMOD)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.sse.2022.108442
Publication URI: http://dx.doi.org/10.1016/j.sse.2022.108442
Type: Journal Article/Review
Parent Publication: Solid-State Electronics