Theoretically probing the relationship between barrier length and resistance in Al/AlO x /Al tunnel junctions (2022)

First Author: Lapham P
Attributed to:  Quantum Electronics Device Modelling (QUANTDEVMOD) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.sse.2022.108442

Publication URI: http://dx.doi.org/10.1016/j.sse.2022.108442

Type: Journal Article/Review

Parent Publication: Solid-State Electronics