An Advanced Calibration Method for Probe Leakage Correction in On-Wafer Test Systems (2023)
Attributed to:
Millimetre-wave and Terahertz On-chip Circuit Test Cluster for 6G Communications and Beyond (TIC6G)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tmtt.2022.3200050
Publication URI: http://dx.doi.org/10.1109/tmtt.2022.3200050
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Microwave Theory and Techniques
Issue: 2