Group 16: Challenge: Task 3 - Detect Defects in Electron Microscopy Images (2022)

First Author: Guo X
Attributed to:  Artificial and Augmented Intelligence for Automated Scientific Discovery funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: http://dx.doi.org/10.5258/SOTON/AI3SD0251

Type: Technical Report

Volume: AI4SD-Machine-Learning-Summer-School

Issue: 8