Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency (2023)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tcad.2022.3193875

Publication URI: http://dx.doi.org/10.1109/tcad.2022.3193875

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Issue: 4