Spectroscopic Investigation of Shallow Hole Traps in Ga- and B-doped Czochralski Silicon: Insight into Light-Induced Degradation (2022)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsaem.2c02852
Publication URI: http://dx.doi.org/10.1021/acsaem.2c02852
Type: Journal Article/Review
Parent Publication: ACS Applied Energy Materials
Issue: 11