Spectroscopic Investigation of Shallow Hole Traps in Ga- and B-doped Czochralski Silicon: Insight into Light-Induced Degradation (2022)

First Author: Meyer A

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsaem.2c02852

Publication URI: http://dx.doi.org/10.1021/acsaem.2c02852

Type: Journal Article/Review

Parent Publication: ACS Applied Energy Materials

Issue: 11