FEM-based analysis of avalanche ruggedness of high voltage SiC Merged-PiN-Schottky and Junction-Barrier-Schottky diodes (2022)

First Author: Shen C

Attributed to: Supergen Energy Networks hub 2018 funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2022.114686

Publication URI: http://dx.doi.org/10.1016/j.microrel.2022.114686

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability