Defect formation and mitigation in Cu/Cu joints formed through transient liquid phase bonding with Cu-Sn nanocomposite interlayer (2022)
Attributed to:
Underpinning Multi-User Equipment
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2022.114681
Publication URI: http://dx.doi.org/10.1016/j.microrel.2022.114681
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability