Polarized angle-resolved spectral reflectometry for real-time ultra-thin film measurement. (2023)
Attributed to:
Future Advanced Metrology Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/oe.481389
PubMed Identifier: 36823908
Publication URI: http://europepmc.org/abstract/MED/36823908
Type: Journal Article/Review
Volume: 31
Parent Publication: Optics express
Issue: 4
ISSN: 1094-4087