Mechanisms of Silicon Surface Passivation by Negatively Charged Hafnium Oxide Thin Films (2023)

First Author: Wratten A
Attributed to:  Charged oxide inversion layer (COIL) solar cells funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jphotov.2022.3227624

Publication URI: http://dx.doi.org/10.1109/jphotov.2022.3227624

Type: Journal Article/Review

Parent Publication: IEEE Journal of Photovoltaics

Issue: 1