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Gain measurements on VCSEL material using segmented contact technique (2023)

First Author: Hentschel C

Attributed to: Compound Semiconductor Underpinning Equipment funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/acaf0b

Publication URI: http://dx.doi.org/10.1088/1361-6463/acaf0b

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 7