Impact of strain-induced bow on the performance of VCSELs on 150mm GaAs- and Ge-substrate wafers (2022)

First Author: Baker J
Attributed to:  Future Compound Semiconductor Manufacturing Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2624492

Publication URI: http://dx.doi.org/10.1117/12.2624492

Type: Conference/Paper/Proceeding/Abstract