A New Approach for 3D Quantitative STEM Using Defocus Corrected Electron Ptychography (2022)
Attributed to:
Fast Pixel Detectors: a paradigm shift in STEM imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927622002252
Publication URI: http://dx.doi.org/10.1017/s1431927622002252
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: S1