A New Approach for 3D Quantitative STEM Using Defocus Corrected Electron Ptychography (2022)

First Author: Mostaed A
Attributed to:  Fast Pixel Detectors: a paradigm shift in STEM imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927622002252

Publication URI: http://dx.doi.org/10.1017/s1431927622002252

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S1