Efficient and quantitative phase imaging in two- and three-dimensions using electron ptychography in STEM

First Author: Nellist P

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/9783527808465.emc2016.6511

Publication URI: http://dx.doi.org/10.1002/9783527808465.emc2016.6511

Type: Book Chapter

Book Title: European Microscopy Congress 2016: Proceedings (2016)

Page Reference: 517-518