Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope (2020)

First Author: Trager-Cowan C
Attributed to:  University of Strathclyde - Equipment Account" funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/ab75a5

Publication URI: http://dx.doi.org/10.1088/1361-6641/ab75a5

Type: Journal Article/Review

Parent Publication: Semiconductor Science and Technology

Issue: 5