Assessing the Impact of Secondary Fluorescence on X-Ray Microanalysis Results from Semiconductor Thin Films. (2022)

First Author: Hunter DA

Attributed to: University of Strathclyde - Equipment Account" funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927622000770

PubMed Identifier: 35611839

Publication URI: http://europepmc.org/abstract/MED/35611839

Type: Journal Article/Review

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

ISSN: 1431-9276