Electric-field-induced annihilation of localized gap defect states in amorphous phase-change memory materials (2022)

First Author: Konstantinou K
Attributed to:  HIGH END COMPUTING MATERIALS CHEMISTRY CONSORTIUM funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2021.117465

Publication URI: http://dx.doi.org/10.1016/j.actamat.2021.117465

Type: Journal Article/Review

Parent Publication: Acta Materialia