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A 'wiring diagram' for source strength traits impacting wheat yield potential. (2023)

First Author: Murchie EH

Attributed to: AAFC IWYP Aligned Call: Increasing Wheat Yield with Multi-omics funded by BBSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1093/jxb/erac415

PubMed Identifier: 36264277

Publication URI: http://europepmc.org/abstract/MED/36264277

Type: Journal Article/Review

Volume: 74

Parent Publication: Journal of experimental botany

Issue: 1

ISSN: 0022-0957