Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions (2022)

First Author: Zhong X

Attributed to: Royce Phase 2 funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927622001155

Publication URI: http://dx.doi.org/10.1017/s1431927622001155

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S1