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Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern. (2023)

First Author: Chan EA

Attributed to: Next Generation Metrology Driven by Nanophotonics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1515/nanoph-2022-0612

PubMed Identifier: 39635469

Publication URI: http://europepmc.org/abstract/MED/39635469

Type: Journal Article/Review

Volume: 12

Parent Publication: Nanophotonics (Berlin, Germany)

Issue: 14

ISSN: 2192-8614