Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern (2023)

First Author: Chan E
Attributed to:  Next Generation Metrology Driven by Nanophotonics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1515/nanoph-2022-0612

Publication URI: http://dx.doi.org/10.1515/nanoph-2022-0612

Type: Journal Article/Review

Parent Publication: Nanophotonics

Issue: 14