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Applications of deep learning in electron microscopy. (2022)

First Author: Treder KP

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1093/jmicro/dfab043

PubMed Identifier: 35275181

Publication URI: http://europepmc.org/abstract/MED/35275181

Type: Journal Article/Review

Volume: 71

Parent Publication: Microscopy (Oxford, England)

Issue: Supplement_1

ISSN: 2050-5698