Characterizing and Modeling RTN Under Real Circuit Bias Conditions (2023)

First Author: Tok K
Attributed to:  Variability-aware RRAM PDK for design based research on FPGA/neuro computing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2023.3253665

Publication URI: http://dx.doi.org/10.1109/ted.2023.3253665

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 5