Bipolar Degradation monitoring of 4H-SiC MOSFET Power Devices by Electroluminescence Measurements (2021)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/iecon48115.2021.9589563

Publication URI: http://dx.doi.org/10.1109/iecon48115.2021.9589563

Type: Conference/Paper/Proceeding/Abstract