Radiation testing of low cost, commercial off the shelf microcontroller board (2021)

First Author: Fried T

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.net.2021.05.005

Publication URI: http://dx.doi.org/10.1016/j.net.2021.05.005

Type: Journal Article/Review

Parent Publication: Nuclear Engineering and Technology

Issue: 10