Analysis of Bi Distribution in Epitaxial GaAsBi by Aberration-Corrected HAADF-STEM (2018)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1186/s11671-018-2530-5
PubMed Identifier: 29696397
Publication URI: http://europepmc.org/abstract/MED/29696397
Type: Journal Article/Review
Parent Publication: Nanoscale Research Letters
Issue: 1
ISSN: 1556-276X