Analysis of Bi Distribution in Epitaxial GaAsBi by Aberration-Corrected HAADF-STEM. (2018)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1186/s11671-018-2530-5

PubMed Identifier: 29696397

Publication URI: http://europepmc.org/abstract/MED/29696397

Type: Journal Article/Review

Volume: 13

Parent Publication: Nanoscale research letters

Issue: 1

ISSN: 1556-276X