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Carrier-free dual-comb distance metrology using two-photon detection

First Author: Wright H.

Attributed to: Frequency-comb enabled metrology for manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85120006199

Type: Conference/Paper/Proceeding/Abstract

Parent Publication: Optics InfoBase Conference Papers