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Analysis of GaN Converter Circuit Stability Influenced by Current Collapse Effect (2020)

First Author: Videt A

Attributed to: Underpinning Power Electronics 2012: Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/apec39645.2020.9124351

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85087759464

Type: Conference/Paper/Proceeding/Abstract