Analysis of GaN Converter Circuit Stability Influenced by Current Collapse Effect (2020)
Attributed to:
Underpinning Power Electronics 2012: Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/apec39645.2020.9124351
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85087759464
Type: Conference/Paper/Proceeding/Abstract