Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films (2019)
Attributed to:
Ultra-Stable High-Performance Single Nanolasers
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/prj.7.000b73
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85074723108
Type: Journal Article/Review
Parent Publication: Photonics Research
Issue: 11