In-situ high dynamic range inspection in Ebeam machine based on fringe projection profilometry (2021)

First Author: Liu Y.
Attributed to:  Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85109215388

Type: Other

Parent Publication: Proceedings of the 21st International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2021