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An iterative calibration method for improving absolute measurement accuracy of stereo deflectometry (2021)

First Author: Xu Y.

Attributed to: Next Generation Metrology Driven by Nanophotonics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85109211891

Type: Other

Parent Publication: Proceedings of the 21st International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2021