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Review on FIB-Induced Damage in Diamond Materials (2016)

First Author: Tong Z

Attributed to: EPSRC Centre for Innovative Manufacturing in Advanced Metrology funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.2174/1573413712666160530105707

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/84995877400

Type: Journal Article/Review

Parent Publication: Current Nanoscience

Issue: 6