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Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films (2022)

First Author: Stehlik M

Attributed to: Manufacturing with Light 2: Lasers Making Lasers funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/1.oe.61.7.071603

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85132074959

Type: Journal Article/Review

Parent Publication: Optical Engineering

Issue: 07