Thickness measurement of circular metallic film using single-frequency eddy current sensor (2021)

First Author: Lu M
Attributed to:  Real-time In-line Microstructural Engineering (RIME) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ndteint.2021.102420

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85101024831

Type: Journal Article/Review

Parent Publication: NDT & E International