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Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University (2012)

First Author: Jiang H

Attributed to: Platform Grant Support for Materials Characterisation at Oxford funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.micron.2011.10.004

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/84857356945

Type: Journal Article/Review

Parent Publication: Micron

Issue: 4