Applications of the Oxford-JEOL aberration-corrected electron microscope (2010)
Attributed to:
Platform Grant Support for Materials Characterisation at Oxford
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1080/14786435.2010.516775
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/77958559607
Type: Journal Article/Review
Parent Publication: Philosophical Magazine
Issue: 35-36