Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

First Author: Kirkland A
Attributed to:  Platform Grant Support for Materials Characterisation at Oxford funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/s1076-5670(08)01008-2

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/67649405008

Type: Book Chapter

Book Title: Advances in IMAGING AND ELECTRON PHYSICS - Aberration-Corrected Electron Microscopy (2008)

Page Reference: 283-325