📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

An enhanced modulated waveform measurement system for characterization of microwave devices under complex modulated excitations (2012)

First Author: Akmal M.

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/84867035640

Type: Journal Article/Review

Volume: 7

Parent Publication: International Journal of Microwave and Optical Technology

Issue: 3

ISSN: 15530396