Evaluation of SiC Schottky Diodes Using Pressure Contacts (2017)

First Author: Ortiz Gonzalez J

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tie.2017.2677348

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85029951866

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Industrial Electronics

Issue: 10