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Calibration of X-ray computed tomography for surface topography measurement using metrological characteristics (2021)

First Author: Thompson A.

Attributed to: Metrology for precision and additive manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85109209296

Type: Other

Parent Publication: Proceedings of the 21st International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2021